With the Beamage-M2, Gentec-EO has now introduced an automated system that can determine the quality of a laser beam in only 20 to 60 seconds by means of an M2 measurement. Available exclusively from LASER COMPONENTS, this system is the only one in the world with a complete set of 50 mm optics. This allows measurements to be made on larger beam diameters and divergence angles. The detector is a particularly large CMOS sensor chip (11.3 x 11.3 mm) with a resolution of 4.2 megapixels. All measurements comply with ISO11146 and ISO13694.
Two adjustable deflecting mirrors ensure that the laser beam can be adjusted easily and flexibly. The beam path is “folded” 180° inside the device via two factory-set deflecting mirrors. This enables 400 mm of travel of beam path at an optimized speed, requiring a minimal amount of space.
With its handy design, the Beamage-M2 can be easily mounted on optical tables. This makes it ideal for use in R&D laboratories. Automatic and manual measurements are possible via user-friendly software.
The beam quality factor M2 describes the difference between the divergence angle of a laser beam and the ideal Gaussian beam. The smaller the value, the better a laser can be focused.
Further product information:
Beam Profilers / Beam Profile Measurement
|Contact Person:||René Bartipan|
|Company:||Laser Components GmbH|
|ZIP / City:||82140 Olching|
|Phone:||+49 (0) 8142 2864-103|
|Fax:||+49 (0) 8142 2864-11|