Contact

Laser Components Germany GmbH
Werner-von-Siemens-Str. 15
82140 Olching / Germany

Phone: +49 (0)8142 / 28 64-0
Fax: +49 (0)8142 / 28 64-11

E-Mail:info@lasercomponents.com

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MAP - Multiple Application Platform

MAP – MAP is the measuring system developed by VIAVI for industrial and laboratory use. There are different measuring platforms available that vary in their number of connection slots. For these platforms plug-in modules for various measurements are available, such as, for example, light sources, filters, or optical switches.

MAP Spectral Measurement Instruments

MAP2xx with tunable filter and laser, utility,  power meter, switch

Spectral measuring units for the MAP system: "swept wavelength" test system, tunable filters, multi-wavelength detectors, OSAs

A series of measuring units is available for spectral measurements: stand-alone systems and modules for the MAP platform.

  • Swept wavelength test system
    Test system for the production and development of passive DWDM components, ROADMs, and circuit packs to fully identify the wavelength-dependent properties of passive optical components.
  • Multi-wavelength detector (mWave) and high-resolution OSA (mHROSA)
    A multi-wavelength detector and high-resolution optical spectrum analyzer with spectral sub-GHz resolution are combined in a single MAP module.

The swept wavelength system (SWS) module is available to measure the wavelength dependency of passive optical elements with the MAP system. It is used for the spectral measurement of optical DWDM components (i.e., for ROADMs, wavelength-selective optical switches, tunable filters, or optical circuit packs. The SWS system comprises the following

  • Tunable laser
  • Optical sources – source optical module (SOM)
  • Receiver chassis
  • Control module
  • Detector module
  • Application software

It is used to measure the following:

  • Insertion loss – IL
  • Return loss – RL
  • Polarization-dependent loss – PDL
  • Directivity

SWS System Features

  • Up to eight measuring stations can be operated at one base
  • Absolute wavelength accuracy ±0.002 nm
  • Up to 256 detectors per receiver station
  • Scanning speed up to 40 nm/s
  • DLLs for customer-specific applications

Multi-wavelength Meter – mWAVE

The measurement principle behind the mWAVE multi-wavelength frequency meter is based on coherent detection technology. The frequency resolution used to determine the optical power level is currently unmatched; the detection of the center wavelengths of densely packed optical signals with a spacing of just 2 GHz is also worth pointing out.

  • Measurement range
    Expanded C band: 196.4-191.1 THz
    is equal to 1526.44-1568.77 nm

 

High-resolution OSA – mHROSA

The mHROSA optical spectrum analyzer ensures a sub-GHz resolution: it combines the WAVE multi-wavelength frequency meter with a high-resolution optical spectrum analyzer (OSA) in a single module of standard width.

Typical applications include the characterization of DWDM transmission systems, optical sources, transponders, and line cards. The mHROSAs are particularly well suited for the characterization of components for 10/40/100/400 G applications.

Features

  • Sub-GHz wavelength resolution
  • Measurement range:
    Expanded C band: 196.4-191.1 THz
    is equal to 1526.44-1568.77 nm
  • Measurement of frequency, optical power level, and OSNR
  • Analysis of side-mode suppression of optical laser sources

Votre contact

Florian Tächl

+49 (0) 8142 2864-38