Si APDs – Optimized for DUV/UV
Avalanche Photodiodes for the Ultraviolet Spectral Range
US28-035
Due to their very high sensitivity and extremely low noise, SUR-series avalanche photodiodes (APDs) are suited for measurements in photometry or in analytical systems as well as for fluorescence measurements.
In addition to the optimized blue and UV spectral range, the APD can be used for measurements in the entire wavelength range between 200 nm and 1000 nm.
SUR500. At 400 nm the SUR500 has a noise equivalent power (NEP) of typically only 9 fW/sqrt(Hz) at a sensitivity of about 28 A/W.
Such values can only be achieved with a special reach-through structure developed by LASER COMPONENTS of just a few nm in thickness.
The SUR series is currently available with an active diameter of 500 µm. Other low-noise versions at 1.5 mm and 3 mm will be available soon.
Datasheet:
Further product information:
Si Avalanche Photodiodes
Manufacturer:
LASER COMPONENTS Detector Group
Contact:
| Contact Person: | Matt Robinson |
| Company: | LASER COMPONENTS USA Inc. |
| Address: | 116 South River Road Building C |
| ZIP / City: | 03110 Bedford, NH |
| Phone: | +1 603 821 7040 |
| Fax: | +1 603 821 7041 |
| Email: | sales@laser-components.com |
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