SUR-Series: UV-Enhanced Silicon Avalanche Photodiode
UK38-0350
UV enhanced APDs have been developed by LASER COMPONENTS. Avalanche photodiodes have a reach through structure allowing low noise and sensitivity in the blue and UV wavelength range superior to any similar detector available on the market. Furthermore, the sensitivity of the new reach-through APD extends further into the DUV than any devices currently available on the market. Its operation as a packaged component is ultimately limited by the transmission of the window, optimised for wavelengths starting at 250 nm.
Such a high sensitivity at wavelengths even shorter than 250 nm has been achieved by our development team. This has been achieved by operating the device under vacuum conditions and a specially designed reach-through structure with an ultra-thin surface top layer grown using a unique epitaxial procedure. An important additional advantage of the new reach-through APD is its unmatched noise and sensitivity performance over the widest commercially available wavelength range, from 250 nm to 1100 nm. APD sizes from 0.5 mm to 3 mm dia. active areas are available.
Datasheet:
Further product information:
Si Avalanche Photodiodes
Manufacturer:
LASER COMPONENTS Detector Group