RAPID
Florida, USA
August 13-15, 2025
As a invited speaker at RAPID + TCT 2025, Dr. Richard S. Kim, Director of R&D at LASER COMPONENTS Detector Group, Inc. will present a comparative study of PbSe and InAsSb photodetectors for mid-infrared applications.
The additive manufacturing industry uses both lead selenide (PbSe) and indium arsenide antimonide (InAsSb) photodetectors for industrial process control in mid-infrared. Dr. Kim will compare the two detector types, focusing on aspects such as operating temperature, sensitivity and response time, and evaluate their suitability for different applications.
RAPID + TCT is a leading additive manufacturing and 3D printing exhibition and conference that brings together experts and professionals from around the world to present and discuss the latest developments and innovations.
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Presentation
Hear about our latest research!
Richard Kim
R&D Director
LASER COMPONENTS
Detector Group
Topic: Comparative Study of IV-VI PbSe
and III-V InAsSb/InAs-GaSb T2SL Photodetectors
for Room Temperature Mid-Infrared Sensing Applications
Friday | August 15th, 2025 | 8:00 am
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