Metrology Systems
MESO Metrology System
Non-contact, 3D surface metrology with sub-micron precision.
This modular metrology system offers fast and highly accurate three-dimensional measurements for quality control and R&D in optics, semiconductors, and precision engineering.
Portable Wavefront Metrology System
Optical Engineer’s Companion (OEC) for fast, precise optical system alignment.
General Information
about Metrology Systems
Shop floor measurements ensure quality control testing and in situ process control of your flat optics right next to the manufacturing line. A unique instrument allows to measure at several different wavelengths with no chromatic aberrations and to characterize the whole range of your optics with no loss of resolution.
